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<p style="mso-margin-top-alt:12.0pt;margin-right:0cm;margin-bottom:12.0pt;margin-left:0cm">
Dear <span lang="EN-US">colleagues</span>,<o:p></o:p></p>
<p class="Default"><span style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000">I'm thrilled to announce that in collaboration with Bruker, we have arranged a workshop titled "Exploring Advanced Materials Characterization with
AFM," scheduled for this week, <b>April 2-5</b>.</span><span style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000">
<u><span lang="EN-US">No registration is required</span></u><span lang="EN-US">.<o:p></o:p></span></span></p>
<p class="Default"><span style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000"><o:p> </o:p></span></p>
<p class="Default"><span style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000">This workshop will
</span><span lang="EN-US" style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000">explore
</span><span style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000">Atomic Force Microscopy (AFM) and its diverse applications in characterizing advanced materials. It offers an invaluable chance for us to expand our knowledge
and expertise in this domain.<o:p></o:p></span></p>
<p class="Default"><span style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000"><o:p> </o:p></span></p>
<p class="Default"><span style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000">Today, marking the inaugural day of the workshop, we have two insightful talks lined up by Bruker experts, taking place at
</span><span lang="EN-US" style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000">the VU in the room
</span><b><span style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000">NU-5A 47</span></b><span style="font-size:11.0pt;color:windowtext;mso-ligatures:none;mso-fareast-language:#2000">.</span><span style="font-size:11.0pt">
<o:p></o:p></span></p>
<p class="Default"><span style="font-size:11.0pt"><o:p> </o:p></span></p>
<p class="Default"><span style="font-size:11.0pt">15:00 - 15:25 </span><b><span style="font-size:11.0pt;color:#006FC0">Oral scientific lectures by Bruker corporate scientist:
</span></b><span style="font-size:11.0pt"><o:p></o:p></span></p>
<p class="Default"><i><span style="font-size:11.0pt;color:#006FC0">“Peak Force Tapping Mode the proven standard in AFM imaging “
</span></i><span style="font-size:11.0pt"><o:p></o:p></span></p>
<p class="Default"><span style="font-size:11.0pt">Dr. Thomas Carlier, AFM Applications Team Europe
<o:p></o:p></span></p>
<p style="mso-margin-top-alt:12.0pt;margin-right:0cm;margin-bottom:12.0pt;margin-left:0cm">
15:30-15:55 <i><span style="color:#006FC0">"Modern AFM modes for nm scale mechanical and nano-electrical characterization of advanced materials.” Here we focus on advanced PFM, conductive AFM, photo-conducive PFM and electrical
</span><b><span style="color:#6F2F9F">DataCube AFM </span></b><span style="color:#006FC0">modes”
</span></i>Dr. Thomas Carlier, AFM Applications Team Europe<span lang="EN-US"><o:p></o:p></span></p>
<p style="mso-margin-top-alt:12.0pt;margin-right:0cm;margin-bottom:12.0pt;margin-left:0cm">
<span lang="EN-US">A</span>fterwards<span lang="EN-US">,</span> students will be trained on the use of this new AFM machine (<a href="https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-xr-afm.html" target="_blank" title="https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-xr-afm.html">https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-xr-afm.html</a>).
As you can see there are really a lot of options. The idea is that you<span lang="EN-US">r students</span> can autonomously perform measurements on samples (for free!) after the training, from the 3 to the 5 of April. I think this is a great opportunity to
measure special properties of our materials with a very powerful machine. If you have samples to measure (also test samples are fine), make sure to contact
<a href="mailto:sergey.lemeshko@bruker.com" target="_blank" title="mailto:sergey.lemeshko@bruker.com">
sergey.lemeshko@bruker.com</a> <span lang="EN-US">(before or after the oral talks of this afternoon).</span><o:p></o:p></p>
<p style="mso-margin-top-alt:12.0pt;margin-right:0cm;margin-bottom:12.0pt;margin-left:0cm">
Your participation is crucial to the success of this workshop, and we look forward to an engaging and insightful event. Find attached the program for more details. <o:p></o:p></p>
<p class="MsoNormal"><span lang="EN-US">Best wishes,<o:p></o:p></span></p>
<p class="MsoNormal"><span lang="en-NL" style="font-size:10.0pt;mso-fareast-language:#2000"><br>
<span style="color:black;background:white">Loreta Angela Muscarella<br>
Assistant Professor, Physics and Astronomy<br>
Vrije Universiteit Amsterdam</span><br>
<span style="color:black;background:white"><img border="0" width="437" height="74" style="width:4.5555in;height:.7708in" id="Picture_x0020_1" src="cid:image001.png@01DA84E9.02E2B7F0" alt="Logo"><br>
<b>Working days: </b>Mo, Tu, We, Th, Fr | <b>T </b>+31 20 59 81525 | <a href="mailto:l.a.muscarella@vu.nl" target="new"><span style="color:#0077B3">l.a.muscarella@vu.nl</span></a><br>
<b>Mailing address:</b> De Boelelaan 1105, 1081 HV Amsterdam<br>
<b>Visiting address:</b> WN U-251 | <a href="https://vu.nl/en/about-vu/more-about/about-the-vu-website" target="new"><span style="color:#0077B3">E-mail disclaimer</span></a> | <a href="https://vu.nl/en/" target="new"><span style="color:#0077B3">www.vu.nl</span></a></span><span style="background:white"><o:p></o:p></span></span></p>
<p class="MsoNormal"><span lang="en-NL"><o:p> </o:p></span></p>
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